Skip to main content

NUANCE: Nanoscale Characterization Experimental Center

The Ultimate SEM Experience

NUANCE was excited to host The Ultimate SEM Experience:  High-Throughput Oxford NanoAnalysis with the Hitachi SU8700 Workshop on Tuesday September 17th, 2024. With 45 guests in attendance guest speakers Astushi Muto from Hitachi High-Tech and Michael Hjelmstad from Oxford Instruments America elaborated on all the new and awesome functions of the Hitachi SU8700 now housed in NUANCE’s EPIC SEM Facility!

Following a delicious catered lunch from local eatery Tomate Fresh Kitchen, attendees who signed up for a live demo on the new instrument retired to the labs to get a personalized introduction to the multitude of capabilities featured on the SU8700.

Thanks again to the planning committee for making this workshop and 3-day demo truly sensational!

Keep an eye out for another installment of this informative workshop series scheduled for Spring 2025!

2024-09-17-hitachi-oxford-tirzah.jpg
Tirzah Abbott, EPIC SEM Facility Manager, welcomes everyone to the workshop
2024-09-17-hitachi-oxford-muto-1.jpg
Atsushi Muto, Assistant Manager of Applications presents his talk: "SU8700 UHR FE-SEM:  Bringing New Value and Capability to the NUance"
 
Mike H of Oxford presenting
Michael Hjelmstad, Applications Specialist with Oxford Instruments America presents his talk: Never Miss a Thing: From Rapid Large Area Screening to Nanoscale Detail with BEX, EDS, and TKD” 
Hitachi/Oxford demo
Students sit with Michael Hjelmstad of Oxford Instruments and Atsushi Muto of Hitachi High-Tech to get some hands on experience with the SU8700
2024-09-17-hitachi-oxford-group-2.jpg
Group Photo of NUANCE's EPIC SEM Facility Staff with Oxford Instruments and Hitachi High-Tech representatives