Standard lower SE detector for topographical information.
5 segment BSE detector for compositional contrast (3D reconstruction capability).
In-lens detectors for ultra high-resolution imaging, including SE, HA-BSE, and LA-BSE.
Low-vacuum mode for enhanced charge suppression.
Cathodoluminescence imaging mode to investigate crystallinity, defects, and optical properties.
Beam deceleration mode for improved low voltage imaging, up to 2.5 kV bias.
STEM-in-SEM detector for low voltage (<30kV) BF- and DF-STEM imaging.
EDS: Oxford Ultim Max 170 mm2 SDD EDS detector and Oxford Ultim Extreme 100 mm2 windowless detector for full-range quantitative elemental characterization, including low kV EDS and light element analysis down to Lithium.
