Characterization Instruments

3D Optical Profiler – Zygo nexview

Atomic Force Microscope – Bruker Edge

Contact Angle Measurement – VCA Optima XE

Electrical Test Station

Nikon LV150

Reflectometer – Filmetrics F20

Spectroscopic Ellipsometer – J.A. Woollam alpha-SE

Stylus Profilometer – Veeco Dektak-8

Thin Film Stress Measurement System – FLX 2320-S