Skip to main content

NUANCE: Nanoscale Characterization Experimental Center

The Ultimate SEM Experience High-Throughput Oxford NanoAnalysis with the Hitachi SU8700

September 17, 2024 @ 9 AM - 1 PM

Ford Hive Annex; Room 2340

 Ford Building Location  Parking Map (North Parking Garage is closest)

REGISTER

Breakfast & Lunch will be provided.

Demos will begin at 1:30 PM.
DEMO SIGN-UP

Space is FULL for the interactive demo sessions, and the sign-up is now closed.

2024-09-17-hitachisu8700_ta.png
The NUANCE Center’s EPIC-SEM facility is excited to welcome you to this workshop focused on the advanced imaging and microanalysis capabilities of the new Hitachi SU8700 SEM with a full array of the latest detectors from Oxford Instruments!

This workshop will provide an in-depth introduction to the new features of this state-of-the-art instrument, with a particular emphasis on recent advances in microanalysis.


2024-09-17-bex-large.png

Workshop Highlights

  • Explore Advanced Imaging Capabilities: Discover how the Hitachi SU-8700 SEM can elevate your research with its innovative imaging technologies. 
  • Advances in Microanalysis: Delve into the scientific advancements made possible by the Ultim Max 170mm²—the largest conventional EDS in NUANCE—and the Unity detector, the world’s first Backscattered Electron and X-ray (BEX) Imaging detector.
  • In-Person Expert Talks: Engage with specialists from Oxford Instruments NanoAnalysis and Hitachi High Tech as they discuss how the latest developments in SEM imaging and microanalysis can enhance your research.
  • Interactive Demonstrations: Observe live demonstrations at the microscope led by experts using your samples. This is a unique opportunity to see the new capabilities in action and ask detailed questions tailored to your research needs.

Schedule

Schedule
8:30 - 9:00 AM Breakfast Available
9:00 - 9:10 AM Opening Remarks
9:10 – 10:25 AM Atsushi Muto, Assistant Manager, Metrology and Analysis Division of Hitachi High-Tech America, Inc.

"SU8700 UHR FE-SEM:  Bringing New Value and Capability to the NUANCE"

10:25 - 10:40 AM  Break
10:40 – 12:00 PM Michael Hjelmstad, Applications Specialist - NanoAnalysis Oxford Instruments America

Never Miss a Thing: From Rapid Large Area Screening to Nanoscale Detail with BEX, EDS, and TKD”

12:00 – 1:30 PM Lunch (provided)
1:30 - 4:30 PM Demos ( sign up times available on 9/17, 9/18, & 9/19)

Speakers

2024-09-17-banner-logo.png