The Ultimate SEM Experience High-Throughput Oxford NanoAnalysis with the Hitachi SU8700
September 17, 2024 @ 9 AM - 1 PM
Ford Hive Annex; Room 2340
Ford Building Location Parking Map (North Parking Garage is closest)
Breakfast & Lunch will be provided. Demos will begin at 1:30 PM.
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The NUANCE Center’s EPIC-SEM facility is excited to welcome you to this workshop focused on the advanced imaging and microanalysis capabilities of the new Hitachi SU8700 SEM with a full array of the latest detectors from Oxford Instruments!
This workshop will provide an in-depth introduction to the new features of this state-of-the-art instrument, with a particular emphasis on recent advances in microanalysis.
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Workshop Highlights
- Explore Advanced Imaging Capabilities: Discover how the Hitachi SU-8700 SEM can elevate your research with its innovative imaging technologies.
- Advances in Microanalysis: Delve into the scientific advancements made possible by the Ultim Max 170mm²—the largest conventional EDS in NUANCE—and the Unity detector, the world’s first Backscattered Electron and X-ray (BEX) Imaging detector.
- In-Person Expert Talks: Engage with specialists from Oxford Instruments NanoAnalysis and Hitachi High Tech as they discuss how the latest developments in SEM imaging and microanalysis can enhance your research.
- Interactive Demonstrations: Observe live demonstrations at the microscope led by experts using your samples. This is a unique opportunity to see the new capabilities in action and ask detailed questions tailored to your research needs.
Schedule
Schedule
8:30 - 9:00 AM |
Breakfast Available |
9:00 - 9:10 AM |
Opening Remarks |
9:10 – 10:25 AM |
Atsushi Muto, Assistant Manager, Metrology and Analysis Division of Hitachi High-Tech America, Inc.
"SU8700 UHR FE-SEM: Bringing New Value and Capability to the NUANCE"
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10:25 - 10:40 AM |
Break |
10:40 – 12:00 PM |
Michael Hjelmstad, Applications Specialist - NanoAnalysis Oxford Instruments America
“Never Miss a Thing: From Rapid Large Area Screening to Nanoscale Detail with BEX, EDS, and TKD”
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12:00 – 1:30 PM |
Lunch (provided) |
1:30 - 4:30 PM |
Demos ( sign up times available on 9/17, 9/18, & 9/19) |
Speakers
Atsushi Muto
Assistant Manager of Applications - Metrology and Analysis Division, Hitachi High-Tech America
Mr. Atsushi Muto is currently an Assistant Manager of Applications in the Metrology and Analysis Division of Hitachi High-Tech America, Inc., and works from the Hillsboro, OR office. He has been with Hitachi for 26 years (10 years with HTA).
In his current role, he supports the Americas providing technical expertise, applications development, and collaborative research activities. His research interests include FE-SEM system development, broad ion beam/focused ion beam applications and variable pressure electron microscopes.
Mr. Atsushi Muto has also had the opportunity to stay at NUANCE Center from 2007 to 2008 as an invited scientist sponsored by Hitachi and supervised by Dr. Vinayak Dravid.
Michael Hjelmstad
Applications Specialist – NanoAnalysis Oxford Instruments Americas
Mike has been with Oxford Instruments for 11 years and has been an Applications Specialist for the NanoAnalysis group in California the last 9 years. Prior to Oxford, Mike worked at another UW (University of Washington) in Seattle as the Lab Manager of the Microfabrication Facility focusing on MEMS and photonic devices. He holds a Bachelors and Masters degree in Materials Science from the University of Michigan.