Skip to main content
Northwestern University

| Exploring Inner Space

NUANCE: Nanoscale Characterization Experimental Center

"Golden Eggs" Image by Michael Barsoum, VPD Group; JEOL JSM-7900FLV

"Spikeball" Image by Shelby Yuan, Stupp Group; Hitachi S-4800



Upcoming Events

NUANCE Tech Talk: BioCryo

11:00 AM - 12:00 PM

Please join us for monthly user meetings! Tech staff will showcase our state-of-the-art capabilities, provide updates on...

Instrument Spotlight

IONTOF M6 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

IONTOF M6 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyzer technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. 


Dr. Xinqi Chen

Keck-II Facility Manager, Research Associate Professor
Office: Technological Institute, AG95
Phone: (847) 491-5505