Skip to main content

NUANCE: Nanoscale Characterization Experimental Center

Broad Ion Beam Milling with the Hitachi IM4000-II

February 24, 2026 -  Ryan Hall, Room #4003

Northwestern University-Evanston Campus
9:00 AM Coffee & Seminar
Live Demos begin at 11:00 AM. (Sign-up required)

NUANCE is hosting a workshop on the Hitachi IM4000 ion mill, a versatile sample preparation tool that uses an argon ion beam to gently mill, polish, and clean sample surfaces. Ion milling is particularly valuable for preparing high-quality cross sections for SEM imaging and for producing damage-free, strain-free surfaces required for high-quality EBSD analysis.

The workshop will begin with a morning technical talk covering ion milling principles, applications, and best practices. In the afternoon, participants will have the opportunity for hands-on consultations and live demonstrations with Hitachi specialists, focused on cross-sectional preparation or final surface polishing for EBSD across a range of materials.

Registration Demo Sign-up
Hitachi IM4000-II Ion Mill
Ion Mill

Sample image

Schedule

9:00 AM - 9:25 AM Coffee & Registration
9:25 AM - 9:30 AM Opening Remarks
Tirzah Abbott, MS, EPIC SEM Facility Manager, NUANCE Center
9:30 AM - 10:30 AM  Jing-jiang Yu, Sr. Product Specialist, Environmental Business Division, Hitachi
Exploring Broad Ion Beam Milling:  Principles, Applications, and Instrumentation
11:00 AM - 5:00 PM Live Demos - Sign up required

Speaker

JJ Yu
Jing-jiang Yu

Sr. Product Specialist Environmental Business Division, Hitachi

"Exploring Broad Ion Beam Milling:  Principles, Applications, and Instrumentation"

Jing-jiang Yu received his Ph.D. degree in chemistry from the University of California, Davis, where his doctoral thesis focused on using scanning probe microscopy to study the size-dependent surface chemistry and biochemistry.

He joined the Hitachi High Technologies of America in 2014, and currently is the Sr. product specialist in the Environmental Business Division to support Hitachi broad ion beam milling, C-SEM and AFM line ups. His area of expertise includes nano-instrumentation, surface science, and application of various microscopy techniques in materials characterization.  

 

 Logos