Should You Choose ToF-SIMS or Magnetic SIMS?
November 7, 2023 @ 10 AM
Cook Hall #2058 - Evanston Campus
Program
In this presentation, we will provide an overview of the SIMS technique, examining both the advantages and limitations of Time-of-Flight SIMS and Magnetic SIMS.
CAMECA’s IMS 7f-Auto magnetic sector dynamic SIMS instrument offers unparalleled depth profiling capabilities with high depth resolution and high dynamic range. The high transmission mass spectrometer is combined with two reactive, high-density ion sources, O2+ and Cs+, thus providing high sputter rate and excellent detection limits. This talk will cover magnetic sector dynamic SIMS operational theory, an introduction to the IMS 7f-Atuo SIMS instrument, and an overview of various applications.
SPEAKER
Adrien VUILLAUME
Product Sales Leader SIMS Academicadrien.vuillaume@ametek.com
Adrien graduated in scientific instrumentation from Polytech’Lille Engineering school, France (2000) and holds an Executive MBA from ESCP Business school, Paris, France (2007).
He started in the field of sales of laboratory instrumentation. First as Sales Engineer for XRF, XRD equipment at PHILIPS ANALYTICAL, France (2000). He then switched to the Industrial metrology market at MITUTOYO (2007) and later to the field of Optical and Electron Microscopy at ZEISS Microscopy (2013) as Sales director.
He joined CAMECA in 2019 as the Sales Manager for the SIMS Product Line for the Academia Market and Service laboratories worldwide.
