HORIBA Scientific Offers Seminar and Demos
On Wednesday, May 22, the NUANCE Center welcomed 30 attendees to the seminar Cross-correlated SPM and TERS/TEPL Characterization: A mandatory technique for proper characterization of 2D semiconductors jointly sponsored by HORIBA Scientific and NUANCE.
After a warm introduction by SPID Facility Manager Dr. Gajendra Shekhawat, the morning presentation of talks included Matt Rosenberger, Dept. of Aero. and Mech. Engineering, University of Notre Dame “Exploring Nano-scale Phenomena in Two-Dimensional Materials with Atomic Force Microscopy”; Andrey Krayev, HORIBA Scientific “TERS imaging reveals nanoscale defects and composition misconceptions in MoSSe/MoSeS Janus crystals”; Dr. Ami Chand “Advances in SPM Probes and Applications - A Perspective View”; Eleonora Isotta, Department of Materials Science and Engineering, Northwestern University “Excitation laser energy dependence of the gap-mode TERS spectra of WS2 and MoS2 on silver”; Thomas Darlington, Columbia University “Tailoring quantum states in 2D materials using tip-enhanced nanoscopy.”
After a morning of presentations and a delicious lunch, participants that signed up for in-person demos, adjourned to the SPID facility to get practical, hands on experience with TERS.
