Skip to main content

NUANCE: Nanoscale Characterization Experimental Center

Dr. Xinqi Chen Hosts January Tech Talk

Dr. Xinqi Chen, Research Associate Professor, hosted a packed January Tech Talk, "XPS or ToF-SIMS?on January 16, 2019.

In this tech talk, XinQi gave a brief introduction of the principle and the applications of X-ray Photoelectron Spectroscopy (XPS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and discussed the strength and weakness of each tool.

You can learn more about XinQi here, and be sure to check out the upcoming Tech Talks and register early!

Dr. Chen presenting his talk

tech talk audience

Dr. Chen presenting his talk