Features
The LabRAM system is a state-of-the-art Raman spectroscopy platform, enhanced with Tip-Enhanced Raman Spectroscopy (TERS) capabilities. This system offers advanced 2D and 3D confocal imaging, spectral analysis, and nanoscale characterization. With multi-laser capabilities, full automation, ultra-low-frequency filters, and true confocal imaging, it is designed to meet the rigorous demands of cutting-edge research in materials science, nanotechnology, and life sciences.
Key Capabilities
Multi-Laser Capability
- Supports multiple wavelengths: 473 nm, 532 nm, 633 nm, and 785 nm.
- Covers Visible to near-IR spectral regions.
- Features direct laser coupling and automated laser switching for seamless operation.
Ultra-Low-Frequency Filters
- Equipped with advanced ultra-low-frequency filters, enabling Raman spectroscopy down to 5 wavenumbers.
- Ideal for studying low-energy phonon modes, lattice vibrations, and phase transitions in crystalline and molecular systems.
True Confocal Microscope
- Provides high spatial resolution imaging.
- Equipped with automated mapping stages and full microscope visualization optics.
- Delivers precise and accurate Raman and photoluminescence (PL) measurements.
High-Performance Raman Spectrometer
- Offers ultimate spectral resolution with multiple gratings and automated switching.
- Enables wide spectral range analysis for both Raman and PL.
- Fully automated system design enhances efficiency and ease of use.
Ultrafast Confocal Imaging
- DuoScan Imaging Technology: Utilizes high-precision, ultra-fast rastering mirrors for:
- Generating variable-sized laser macro-spots.
- Achieving nano-step mapping from deep UV to NIR.
- SWIFT Module: Synchronizes high optical throughput with optimized detector-stage coordination, enabling:
- High-resolution confocal Raman mapping in seconds, even at macro scales.
NUcore RESERVATION
Integration with TERS (Tip-Enhanced Raman Spectroscopy)
The integration of TERS extends the LabRAM system’s capabilities to achieve molecular-level spatial resolution. By combining scanning probe microscopy (SPM) with Raman spectroscopy, TERS dramatically enhances Raman signal sensitivity and spatial resolution.
Enhanced Features with TERS
- Photoconducting AFM: Enables nanoscale electrical characterization by mapping local photoresponses, critical for photovoltaic and optoelectronic research.
- Electrical AFM: Provides high-resolution mapping of electrical properties, ideal for studying semiconductors, conductive materials, and electronic devices.
Advantages of TERS
- Nanoscale Resolution: Resolves structures below the diffraction limit, achieving molecular and atomic-level spatial resolution.
- Enhanced Signal Sensitivity: Amplifies Raman signals through localized surface plasmon resonances at the metallic tip.
- Correlated Imaging: Simultaneously provides topographic, electrical, and chemical mapping for comprehensive material analysis.
Surface and Interface Analysis: Optimized for studying thin films, nanostructures, and biological samples.
Applications
With TERS, ultra-low-frequency filters, and advanced AFM capabilities, the LabRAM system excels in:
- Nanomaterial characterization (e.g., 2D materials, nanostructures).
- Studying low-frequency vibrational modes for crystal and molecular analysis.
- Photovoltaic and optoelectronic material analysis with photoconducting AFM.
- Electrical property mapping of semiconductors and conductive polymers with electrical AFM.
- Surface-enhanced Raman scattering (SERS) and ultra-sensitive biological studies.
- Simultaneous chemical, electrical, and topographic analysis for semiconductor defect analysis and device optimization.
The combination of TERS capabilities, ultra-low-frequency filters, and photoconducting and electrical AFM functionalities makes the LabRAM system a versatile, comprehensive platform for nanoscale research, offering unparalleled precision and sensitivity across a wide range of scientific applications.
