Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on a large-sample, tip-scanning AFM
Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in Tapping Mode
Drift rates less than 200pm per minute render distortion-free images
Reduces occurrence of artifacts due to dull or broken probe tips
Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation
Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features
Piezoresponse Force Modulation Lateral Force Microscopy (LFM) Magnetic Force Microscopy (MFM) Electric Force Microscopy (EFM) Surface Potential Scanning
