JEOL ARM200CF Aberration-Corrected TEM
Instrument Details
Features
- Cold FEG – Flash & Go
- 200 kV acceleration voltage
- Aberration corrected (probe)
- 0.08 nm STEM resolution
- 0.23 nm TEM resolution
- 0.35 eV energy resolution
- Dual SDD EDS detector (1.7sr)
- Simultaneous HAADF/BF/ABF
- Gatan Quantum Dual EELS
- Atomic resolution at 60-200kV
- Gatan OneView CMOS camera
JEOL ARM200CF TEM
NUcore RESERVATION
Facility Contact
Dr. Xiaobing Hu
TEM Facility Manager
Office: Tech, #JG14
847-467-4992 / EmailLocation
Technological Institute JG27