Hitachi S4800-II cFEG SEM
Instrument Details
Features
- Cold source Field Emission SEM
- 1.4nm resolution at 1kV with beam deceleration.
- 1.0nm resolution at 15kV.
- Double condenser optics.
- High resolution Through The Lens (TTL) SE detector (upper).
- In chamber topographical SE detector (lower).
- Large 5axis computer eucentric stage (110mm x 110mm).
- Oxford INCA SiLi EDS System.
- 1.5kV beam deceleration mode for low-voltage imaging.
- Leica cryo stage with VCT100 transfer system and suite of cryogenic preparation equipment.
- For cryo-SEM, contact BioCryo for information
Hitachi S4800-II cFEG SEM
NUcore RESERVATION
Facility Contact
Tirzah Abbott, MS
SEM Facility Manager
Office: Tech, #AG92
847-467-0789 / EmailLocation
Technological Institute AB wing; AG83