Near-Axis Transmission Kikuchi Diffraction (NA-TKD) and STEM Techniques in SEM: NUANCE

Near-Axis Transmission Kikuchi Diffraction (NA-TKD) and STEM Techniques in SEM

The Near-Axis Transmission Kikuchi Diffraction (NA-TKD) and STEM Techniques in SEM workshop offers hands-on training in advanced transmission-based methods for nanoscale SEM characterization. Featuring expert talks and live demos, it highlights Oxford Instruments’ new NA-TKD head for the Symmetry S3 EBSD detector on the Hitachi SU8700 and STEM imaging using Hitachi HTA’s specialized detector setup. Participants will explore cutting-edge applications, learn practical data strategies, and engage directly with specialists—ideal for both newcomers and advanced users seeking to expand STEM-in-SEM capabilities.

May 6-8, 2025

Ford Hive - Room 2350

REGISTER now - workshop & demos

May 7, 2025 - Workshop Talks & Coffee

May 6, 7 & 8, 2025 - Live Demos (Sign-up required)

Sign-up for the demos is available in the registration. Space is limited!

Ford Building Location Parking Map (North Parking Garage is closest)

Schedule - May 7, 2025

8:45 - 9:20 AM	Coffee & Check-In
9:20 - 9:30 AM	Opening Remarks Tirzah Abbott, EPIC SEM Facility Manager, NUANCE Center
9:30 – 10:15 AM	Mike Hjelmstad, Sr. Applications Specialist at Oxford Instruments Near-Axis Transmission Kikuchi Diffraction (NA-TKD) for achieving high spatial resolution microstructure data
10:15 - 10:40 AM	Mike Barsoum, Graduate Student, Dravid Research Group Optimized Holder Design for Near-Axis TKD: Enabling Analysis of Beam-Sensitive Samples
10:40 – 10:50 AM	Coffee Break
10:50 – 11:35 AM	Atsushi Muto, Hitachi High-Tech America, Inc. Unlocking New Capabilities with the SU8700 UHR FE-SEM

Speakers

Mike Hjelmstad Sr. Applications Specialist, Oxford Instruments	"Near-Axis Transmission Kikuchi Diffraction (NA-TKD) for achieving the high spatial resolution microstructure data" Electron Backscatter Diffraction (EBSD) is a powerful tool for directly analyzing microstructure in the SEM. Unfortunately, spatial resolution of this technique is limited by the fact it is typically performed at 70° tilt. A new technique called Transmission Kikuchi Diffraction (TKD) was introduced and improved spatial resolution in mapping the microstructure properties like grain size by an order of magnitude down to nearly 10nm.¹ Now limitations in resolution relate more to the higher specimen current TKD requires. In this talk, a new configuration called Near-Axis TKD (NA-TKD) will be proposed. The configuration requires less beam current and could push the resolution limits of TKD even lower. ¹R.R. Keller, R.H. Geiss, J. of Microscopy, 245, 2012, pp 245-51.
Atsushi Muto Hitachi High-Tech America, Inc.	"Unlocking New Capabilities with the SU8700 UHR FE-SEM" In this presentation, Atsushi Muto will explore the advanced capabilities of the SU8700 UHR FE-SEM and its applications in material characterization. The talk will cover key features such as simultaneous 6-signal imaging, real top surface imaging, material characterization using CL signals, and 3D information modeling. Attendees will gain insights into the high-definition signal detection capabilities, automated workflows, and the versatility of the SU8700 in imaging non-conductive samples. The presentation will also highlight the successful detection of lithium in battery electrode films, demonstrating the practical applications of the SU8700 in research and development. This session aims to help NUANCE SU8030, S-3400N, and other SEM users discover new application solutions using the SU8700.
Mike Barsoum Graduate Student, Dravid Research Group	"Optimized Holder Design for Near-Axis TKD: Enabling Analysis of Beam-Sensitive Samples"