Features

• Analyzer type: 180-degree double-focusing, hemispherical analyzer with 128-channel detector
• X-ray source type: Monochromated, micro-focused, low-power Al K-Alpha X-ray source
• X-ray spot size: 10 to 400 um (adjustable in 5 um step)
• Depth profiling: EX06 monatomic Ar ion source and cluster Ar ion source
• Maximum sample area: 60 mm x 60 mm
• Maximum sample thickness: 20 mm
• Sample transfer: Fully automatic transfer
• Air free transfer: equipped
• Sample rotation: equipped

XPS: NEXSA G2

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