Features
- Significantly reduces specimen contamination during both SEM and TEM imaging and microanalysis.
Dr. Xiaobing Hu
TEM Facility Manager
Office: Tech, #JG14
847-467-4992 / xbhu@northwestern.edu
Dr. Paul Smeets
TEM/FIB Facility Manager
Office: Tech, #AG96
847-491-7807 / paul.smeets@northwestern.edu