Keck-II - Instruments
The cutting-edge Instruments at the Keck-II Facility:
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3D Optical Microscope
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Bruker LUMOS FTIR Microscope
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Fourier Transform Infrared (FT-IR) Spectroscopy
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High Resolution Stylus Profilometer
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Spectroscopic Ellipsometer
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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
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X-ray Photoelectron Spectroscopy (XPS/ESCA) |
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Zetasizer
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NEXSA G2 XPS
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